sung mo steve kang
Modeling of Electrical Overstress in Integrated Circuits
EbookSofort lieferbarElectrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threa...
Hot-Carrier Reliability of MOS VLSI Circuits
EbookSofort lieferbarAs the complexity and the density of VLSI chips increase with shrinking design rules, the evaluat...
Physical Design for Multichip Modules
EbookSofort lieferbarPhysical Design for Multichip Modules collects together a large body of important research work t...
Design Automation for Timing-Driven Layout Synthesis
EbookSofort lieferbarMoore's law [Noy77], which predicted that the number of devices in tegrated on a chip would be d...
Electrothermal Analysis of VLSI Systems
EbookSofort lieferbarList of Figures. List of Tables. Preface. Acknowledgments.Part I: The ...
Electrothermal Analysis of VLSI Systems
BuchBezug 11-15Electrothermal Analysis of VLSI Systems addresseselectrothermal problems in modern VLS...
Design Automation for Timing-Driven Layout Synthesis
BuchBezug 11-15Moore's law [Noy77], which predicted that the number of devices in tegrated on a chip would be do...
Physical Design for Multichip Modules
BuchBezug 11-15Physical Design for Multichip Modules collects togethera large body of important resea...
Design Automation for Timing-Driven Layout Synthesis
TaschenbuchBezug 11-15Moore's law [Noy77], which predicted that the number of devices in tegrated on a chip would be do...
Physical Design for Multichip Modules
TaschenbuchBezug 11-15Physical Design for Multichip Modules collects togethera large body of important resea...
Hot-Carrier Reliability of MOS VLSI Circuits
TaschenbuchBezug 11-15As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluat...
Electrothermal Analysis of VLSI Systems
TaschenbuchBezug 11-15Electrothermal Analysis of VLSI Systems addresseselectrothermal problems in modern VLS...
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